WebMining IC test data to optimize VLSI testing. abinaya abi. 2000, Proceedings of the sixth ACM SIGKDD international conference on Knowledge discovery and data mining - KDD '00. In this paper, we report our experiences with … http://dictionary.sensagent.com/Data%20mining/en-en/
Data Mining for Improving the Quality of Manufacturing: A …
WebThis paper presents a technique that allows test engineers to visually analyze and explore within memory chip test data. We represent the test results from a generation of chips along a traditional 2D grid and a spiral. We also show correspondences in the test results across multiple generations of memory chips. WebMining IC test data to optimize VLSI testing (2000) by T Fountain, T G Dietterich, B Sudyka Venue: In Proceedings of the Sixth ACM SIGKDD International Conference on Knowledge Discovery and Data Mining: Add To MetaCart. Tools. Sorted by: Results 1 - 9 of 9. Indexing of Compressed Time Series by ... setup.brother.com sw
Mining IC test data to optimize VLSI testing - academia.edu
Web1 aug. 2000 · Mining IC test data to optimize VLSI testing Applied computing Operations research Decision analysis Computing methodologies Artificial intelligence Control … WebChipViz: visualizing memory chip test data. × Close Log In. Log in with Facebook Log in with Google. or. Email. Password. Remember me on this computer. or reset password. Enter the email address you signed up with and we'll email you a reset link. Need an account? Click here to sign up. Log In Sign Up. Log In; Sign ... Web22 okt. 2014 · Mining IC Test Data to Optimize VLSI Testing Tony Fountain Thomas Dietterich Bill Sudyka 2000 ACM Press DOI: 10.1145/347090.347099 Abstract We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. setup。brother.com